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RF testing for IBM SiGe devices: wafer-level and packaged parts SiGe testing US&Europe

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ID#: 43134

Solution name:        

RF testing for IBM SiGe devices: wafer-level and packaged parts SiGe testing US&Europe

Solution description:

Presto’s Hubs in Silicon Valley and Europe support characterization and production testing of IBM® SiGe designs in both wafer and packaged form.

Solution web page: 


Date last modified:    Jan 21, 2015


Contact information

Daniel Lee
1-408-372-9507

Company

Presto Engineering, Inc.
109 Bonaventura Drive
San Jose, CA 95134
United States

+1 408 3729507

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